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Advances in surface chemical analysis of thin film solid-state battery materials and development of operando measurement capability
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, p. 3448
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- August 2021
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Chemical Surface Analysis of Materials: Recent Developments and the Tremendous Growth in Demand for the Technique
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1010-1011
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- August 2020
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Recent Developments in XPS - Microspectroscopy, Spectromicroscopy, Lateral and Depth Information towards Cutting-Edge Solid Electrolytes and Biomaterials
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1034-1035
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- August 2018
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The Use of Argon Cluster Ion Sources in Etching of Inorganic Materials with Reduced Chemical Damage: Toward a Better Understanding of Interface Chemistry
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2094-2095
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- August 2014
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Fundamental Aspects of XPS and the Development of XPS Imaging
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- Journal:
- Microscopy Today / Volume 19 / Issue 2 / March 2011
- Published online by Cambridge University Press:
- 28 February 2011, pp. 16-21
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- March 2011
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